Introduction to Lecture 12 Vlsi System Testing Test Pattern Generation For Combinational Circuits
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Lecture 12 Vlsi System Testing Test Pattern Generation For Combinational Circuits Comprehensive Overview
BIST Hierarchy, BIST Implementation, BIST Testing Subject -
VLSI testing
Summary & Highlights for Lecture 12 Vlsi System Testing Test Pattern Generation For Combinational Circuits
- VLSI testing
- In this video we will discuss ATPG, advantages and drawbacks in comparison to TPG.
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- ATPG Algorithm, Roth's D-Algorithm (D-ALG), Goel's PODEM algorithm, Fujiwara and Shimono's FAN algorithm, Prime Implicants, ...
- Subject -
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